Electromigration effect upon the Sn/Ag and Sn/Ni interfacial reactions at various temperatures

• C.-M. Chen

• S.-W. Chen

収録刊行物

• Acta Materialia

  Acta Materialia 50 (9), 2461-2469, 2002-05

  Elsevier BV

キーワード

• Metals and Alloys
• Polymers and Plastics
• Ceramics and Composites
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1361981469869501568
• NII論文ID: 80015281018
• DOI: 10.1016/s1359-6454(02)00076-9
• ISSN: 13596454
• Web Site: https://api.elsevier.com/content/article/PII:S1359645402000769?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:S1359645402000769?httpAccept=text/plain
• データソース種別:
  • Crossref
  • CiNii Articles