Basal plane slip and formation of mixed-tilt boundaries in sublimation-grown hexagonal polytype silicon carbide single crystals
Journal
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- J. Appl. Phys.
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J. Appl. Phys. 92 778-785, 2002
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Details 詳細情報について
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- CRID
- 1572824501585136000
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- NII Article ID
- 80015468966
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- Data Source
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- CiNii Articles