Lambertian reflectance and linear subspaces
Journal
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- IEEE Transactions on Pattern Analysis and Machine Intelligence
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IEEE Transactions on Pattern Analysis and Machine Intelligence 25 (2), 218-233, 2003-02
Institute of Electrical and Electronics Engineers (IEEE)
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Keywords
Details 詳細情報について
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- CRID
- 1363388843271189632
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- NII Article ID
- 80015764807
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- ISSN
- 01628828
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- Data Source
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- Crossref
- CiNii Articles