A 90-nm Low-Power 32-kB Embedded SRAM With Gate Leakage Suppression Circuit for Mobile Applications

• K. Nii

• Y. Tsukamoto

• T. Yoshizawa

• S. Imaoka

• Y. Yamagami

• T. Suzuki

• A. Shibayama

• H. Makino

• S. Iwade

収録刊行物

• IEEE Journal of Solid-State Circuits

  IEEE Journal of Solid-State Circuits 39 (4), 684-693, 2004-04

  Institute of Electrical and Electronics Engineers (IEEE)

キーワード

• Electrical and Electronic Engineering

詳細情報

• CRID: 1362262945608751232
• NII論文ID: 80016585228
• DOI: 10.1109/jssc.2004.825235
• ISSN: 00189200
• Web Site: http://xplorestaging.ieee.org/ielx5/4/28587/01278588.pdf?arnumber=1278588
• データソース種別:
  • Crossref
  • CiNii Articles