Nanoscale fin-FETs with gate-source/drain underlap

• TRIVEDI V. P.

収録刊行物

• IEEE Trans. Electron Devices

  IEEE Trans. Electron Devices 52 (1), 56-62, 2005

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• CRID: 1573387451287278720
• NII論文ID: 80017186832
• データソース種別:
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