Precise isotopic measurements of sub-nanogram Nd of standard reference material by thermal ionization mass spectrometry using the NdO^+ technique

• LI C.-F.

収録刊行物

• International Journal of Mass Spectrometry

  International Journal of Mass Spectrometry 266 34-41, 2007

詳細情報

• CRID: 1570854176493352448
• NII論文ID: 80018271399
• データソース種別:
  • CiNii Articles