Uniaxial-process-induced strained-Si : extending the CMOS roadmap
収録刊行物
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- IEEE Trans Electron Devices.
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IEEE Trans Electron Devices. 53 (5), 1010-1020, 2006
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- CRID
- 1573950401221732608
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- NII論文ID
- 80019142794
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- データソース種別
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- CiNii Articles