Extending the relevant component analysis algorithm for metric learning using both positive and negative equivalence constraints

• YEUNG D. Y.

収録刊行物

• Pattern Recognit.

  Pattern Recognit. 39 (5), 1007-1010, 2006

詳細情報

• CRID: 1572543026338099712
• NII論文ID: 80019272744
• データソース種別:
  • CiNii Articles