Applications of X-ray topographic methods to materials science

著者

• France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science
• Weissmann, Sigmund
• Balibar, Françoise
• Petroff, Jean-François
• Centre national de la recherche scientifique (France)
• National Science Foundation (U.S.)

書誌事項

Applications of X-ray topographic methods to materials science

edited by Sigmund Weissmann, Françoise Balibar, and Jean-François Petroff

Plenum Press, c1984

注記

"Based on the proceedings of the France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science, held August 7-10, 1983, in Snowmass Village, Colorado, which was sponsored jointly by CNRS and NSF"--T.p. verso

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA00019363
• ISBN:
  • 030641838X
• LCCN: 84018100
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: xiii, 536 p.
• 大きさ: 26 cm
• 分類:
  • LCC : TA417.25
  • DC19 : 620.1/1272
• 件名:
  • LCSH : Radiography, Industrial -- Congresses
  • LCSH : X-rays -- Industrial applications -- Congresses