Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985

著者

• International Symposium on Defect Recognition and Image Processing in III-V Compounds
• Fillard, J. P.

書誌事項

Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985

edited by J.P. Fillard

（Materials science monographs, 31）

Elsevier, 1985

注記

Includes bibliographies and index

• NII書誌ID(NCID): BA00230809
• ISBN:
  • 0444425586
• LCCN: 85020674
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Amsterdam ; Tokyo
• ページ数/冊数: xii, 306 p.
• 大きさ: 25 cm
• 分類:
  • LCC : TK7871.85
  • DC19 : 621.3815/2
• 件名:
  • LCSH : Semiconductors -- Defects -- Congresses
  • LCSH : Gallium arsenide -- Congresses
  • LCSH : Image processing -- Congresses
• 親書誌ID:
  • BA00014483