Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985

Author(s)

• International Symposium on Defect Recognition and Image Processing in III-V Compounds
• Fillard, J. P.

Bibliographic Information

Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985

edited by J.P. Fillard

（Materials science monographs, 31）

Elsevier, 1985

Note

Includes bibliographies and index

• NCID: BA00230809
• ISBN:
  • 0444425586
• LCCN: 85020674
• Country Code: ne
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Amsterdam ; Tokyo
• Pages/Volumes: xii, 306 p.
• Size: 25 cm
• Classification:
  • LCC : TK7871.85
  • DC19 : 621.3815/2
• Subject Headings:
  • LCSH : Semiconductors -- Defects -- Congresses
  • LCSH : Gallium arsenide -- Congresses
  • LCSH : Image processing -- Congresses
• Parent Bibliography ID:
  • BA00014483