VLSI testing

Author(s)

• Williams, T. W.

Bibliographic Information

VLSI testing

edited by T.W. Williams

（Advances in CAD for VLSI, v. 5）

North-Holland , Sole distributors for the U.S.A. and Canada, Elsevier Science, 1986

Note

Includes bibliographies

Details

• NCID: BA00276923
• ISBN:
  • 0444878955
• LCCN: 86004410
• Country Code: ne
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Amsterdam ; New York,New York
• Pages/Volumes: ix, 275 p.
• Size: 25 cm
• Classification:
  • LCC : TK7874
  • DC19 : 621.395
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing
• Parent Bibliography ID:
  • BA00122657