Author(s)
Bibliographic Information
EMIS datareviews series
INSPEC, Institution of Electrical Engineers
- Other Title
-
EMIS data reviews series
Search this Book/Journal
-
1
- Properties of amorphous carbon
-
edited by S. R. P. Silva
The Institution of Engineering and Technology 2008 EMIS datareviews series no. 29
: paperback
Available at 1 libraries
-
2
- Properties of silicon germanium and SiGe : carbon
-
edited by Erich Kasper and Klara Lyutovich
Institution of Electrical Engineers c2006 EMIS datareviews series no. 24
: [pbk.]
Available at 1 libraries
-
3
- Properties of crystalline silicon
-
edited by Robert Hull
Institution of Electrical Engineers c2006 EMIS datareviews series no. 20
: [pbk.]
Available at 3 libraries
-
4
- Properties of silicon carbide
-
edited by Gary L. Harris
IEE c2006 EMIS datareviews series 13z
Available at 2 libraries
-
5
- Properties of amorphous carbon
-
edited by S. Ravi P. Silva
INSPEC, Institution of Electrical Engineers c2003 EMIS datareviews series no. 29
Available at 4 libraries
-
6
- Properties of lithium niobate
-
edited by K.K. Wong
INSPEC/Institution of Electrical Engineers c2002 EMIS datareviews series no. 28
Available at 3 libraries
-
7
- Properties, growth and applications of diamond
-
edited by M. H. Nazaré and A. J. Portugal
INSPEC, Institution of Electrical Engineers c2001 EMIS datareviews series no. 26
Available at 7 libraries
-
8
- Physical properties of liquid crystals: nematics
-
edited by David Dunmur, Atsuo Fukuda and Geoffrey Luckhurst
INSPEC, Institution of Electrical Engineers c2001 EMIS datareviews series no. 25
Available at 2 libraries
-
9
- Properties of silicon germanium and SiGe : carbon
-
edited by Erich Kasper and Klara Lyutovich
INSPEC, Institution of Electrical Engineers c1999 EMIS datareviews series no. 24
Available at 7 libraries
-
10
- Properties, processing and applications of indium phosphide
-
edited by T. P. Pearsall
Institution of Electrical Engineers 1999 EMIS datareviews series no.21
Available at 2 libraries
-
11
- Properties, processing and applications of gallium nitride and related semiconductors
-
edited by James H. Edgar ... [et al.]
INSPEC c1999 EMIS datareviews series no.23
Available at 12 libraries
-
12
- Properties of crystalline silicon
-
edited by Robert Hull
INSPEC, Institution of Electrical Engineers c1999 EMIS datareviews series no. 20
Available at 15 libraries
-
13
- Properties, processing and applications of glass and rare earth-doped glasses for optical fibres
-
edited by Dan Hewak
INSPEC c1998 EMIS datareviews series no.22
Available at 8 libraries
-
14
- Properties of amorphous silicon and its alloys
-
edited by Tim Searle
INSPEC, Institution of Electrical Engineers c1998 EMIS datareviews series no. 19
Available at 9 libraries
-
15
- Properties of porous silicon
-
edited by Leigh Canham
INSPEC, Institution of Electrical Engineers c1997 EMIS datareviews series no. 18
Available at 16 libraries
-
16
- Properties of wide bandgap II-VI semiconductors
-
edited by Rameshwar Bhargava
INSPEC, Institution of Electrical Engineers c1997 EMIS datareviews series no. 17
Available at 18 libraries
-
17
- Properties of gallium arsenide
-
INSPEC, Institution of Electrical Engineers c1996 3rd ed. / edited by M.R. Brozel and G.E. Stillman EMIS datareviews series no. 16
Available at 8 libraries
-
18
- Properties of III-V quantum wells and superlattices
-
edited by Pallab Bhattacharya
INSPEC c1996 EMIS datareviews series No. 15
Available at 11 libraries
-
19
- Properties of silicon carbide
-
edited by Gary L. Harris
INSPEC c1995 EMIS datareviews series no. 13
Available at 13 libraries
-
20
- Properties of strained and relaxed silicon germanium
-
edited by Erich Kasper
INSPEC, IEE c1995 EMIS datareviews series no. 12
Available at 8 libraries