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EMIS datareviews series
INSPEC, Institution of Electrical Engineers
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EMIS data reviews series
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21
- Properties of metal silicides
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edited by Karen Maex and Marc van Rossum
INSPEC c1995 EMIS datareviews series no.14
Available at 12 libraries
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22
- Properties of group III nitrides
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edited by James H. Edgar
INSPEC, the Institution of Electrical Engineers c1994 EMIS datareviews series no. 11
Available at 15 libraries
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23
- Properties and growth of diamond
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edited by Gordon Davies
Institution of Electrical Engineers c1994 EMIS datareviews series no. 9
Available at 10 libraries
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24
- Properties of narrow gap cadmium-based compounds
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edited by Peter Capper
INSPEC c1994 EMIS datareviews series No. 10
Available at 7 libraries
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25
- Properties of lattice-matched and strained indium gallium arsenide
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edited by Pallab Bhattacharya
INSPEC 1993 EMIS datareviews series no. 8
Available at 10 libraries
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26
- Properties of aluminium gallium arsenide
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edited by Sadao Adachi
INSPEC, Institution of Electrical Engineers c1993 EMIS datareviews series no. 7
Available at 22 libraries
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27
- Properties of indium phosphide
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INSPEC c1991 EMIS datareviews series no. 6
Available at 14 libraries
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28
- Properties of gallium arsenide
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INSPEC, Institution of Electrical Engineers c1990 2nd ed EMIS datareviews series no. 2
Available at 18 libraries
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29
- Properties of lithium niobate
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INSPEC, Institution of Electrical Engineers c1989 EMIS datareviews series no. 5
Available at 4 libraries
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30
- Properties of amorphous silicon
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INSPEC, Institution of Electrical Engineers c1989 2nd ed EMIS datareviews series no. 1
Available at 12 libraries
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31
- Properties of silicon
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INSPEC, Institution of Electrical Engineers c1988 EMIS datareviews series no. 4
Available at 16 libraries
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32
- Properties of mercury cadmium telluride
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editors, John Brice and Peter Capper
INSPEC, Institution of Electrical Engineers c1987 EMIS datareviews series no. 3
Available at 2 libraries
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33
- Properties of gallium arsenide
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INSPEC, Institution of Electrical Engineers c1986 EMIS datareviews series no. 2
Available at 7 libraries
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34
- Properties of amorphous silicon
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INSPEC, Institution of Electrical Engineers c1985 EMIS datareviews series no. 1
Available at 3 libraries
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