Advances in X-ray analysis

著者

• Conference on Application of X-ray Analysis
• Denver Research Institute
• JCPDS-International Centre for Diffraction Data
• Barrett, C. S. (Charles Sanborn)
• Predecki, Paul K.
• Leyden, Donald E.
• Gilfrich, John V.

書誌事項

Advances in X-ray analysis

edited by Charles S. Barrett, Paul K. Predecki and Donald E. Leyden

Plenum, c1985-

• v. 28
• v. 31
• v. 32
• v. 33
• v. 34
• v. 35A
• v. 35B
• v. 36
• v. 37
• v. 38
• v. 39
• v. 40

注記

Vol. 28: "Proceedings of the 1984 Denver Conference on the Applications of X-Ray Analysis, held July 30-August 3,1984, in Denver, Colo."

Vol. 31: "Proceedings of the 36th Annual Conference on Applications of X-ray Analysis, held August 3-7, 1987 in Denver, Colo."

Vol. 31, 32, 33, 34, 35. edited by Charles S. Barrett ...[et al.] ; sponsored by University of Denver Department of Engineering and JCPDS-International Centre for Diffraction Data

Vol. 32: "Proceedings of the 37th Annual Conference on Applications of X-Ray Analysis, held August 1-5, 1988, in Steamboat Springs, Colorado"

Vol. 33: "Proceedings of the 38th Annual Conference on Applications of X-ray Analysis, held July 31-August 4, 1989, in Denver, Colorado"

Vol. 34: "Proceedings of the 39th Annual Conference on Applications of X-ray Analysis, held July 30-August 3, 1990, in Steamboat Springs, Colorado"

Vol. 35: "Proceedings of the 40th Annual Conference on Applications of X-ray Analysis, held August 7-16, 1991, in Steamboat Springs, Colorado"

Vol. 36, 37. edited by John V. Gilfrich ... [et al.] ; sponsored by University of Denver Department of Engineering and International Centre for Diffraction Data

Vol. 36: "Proceedings of the 41st Annual Conference on Applications of X-ray Analysis, held August 3-7, 1992, in Colorado Springs, Colorado"

Vol. 37: "Proceedings of the 42nd Annual Conference on Applications of X-Ray Analysis, held August 2-6, 1993, in Denver, Colorado"

Vol. 38: "Proceedings of the 43rd Annual Conference on Applications of X-Ray Analysis, held August 1-5, 1994, in Steamboat Springs, Colorado"

vol. 39: "Proceedings of the 44th Annual Conference on Applications of X-Ray Analysis, held July 31-August 4, 1995, in Colorado Springs, Colorado"

vol. 40: "Proceedings of the 45th Annual Conference on Applications of X-Ray Analysis, held August 3-8, 1996, Denver, Colorado" CD-ROM

36th, 38th, 42nd : 1987, 1989, 1993 : Denver, Colorado

37th, 39-40th, 43rd : 1988, 1990-1991, 1994 : Steamboat Spring, Colorado

41st, 44th : 1992, 1995 : Colorado Spring, Colorado

内容説明・目次

巻冊次

v. 28 ISBN 9780306419393

内容説明

The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer­ ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura­ tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom­ etry plays in the arsenal of analytical methods found in modern labora­ tories. Total reflectance X-ray spectrometry takes advantage of con­ sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.

目次

I. The Role of X-Ray Fluorescence in a Modern Analytical Laboratory (Plenary Session Papers).- Total Reflectance X-Ray Spectrometry.- XRF and Other Surface Analysis Techniques.- The Role of X-Ray Fluorescence in a Modern Geochemical Laboratory.- II. Mathematical Models And Computer Applications In XRF.- Use of Primary Beam Filtration in Estimating Mass Attenuation Coefficients by Compton Scattering.- An Evaluation of Correction Algorithms, Using Theoretically Calculated Intensities.- Monte Carlo Simulations of XRF Intensities in Samples Containing a Dispersed Phase.- Two Easily-Overlooked Sources of Error in XRF Intensity Measurements.- Coordination Analysis by High Resolution X-Ray Spectroscopy.- III. New Techniques and Instrumentation in XRF.- The Application of Tunable Monochromatic Synchrotron Radiation to the Quantitative Determination of Trace Elements.- Energy Dispersive X-Ray Fluorescence Analysis Using Synchroton Radiation.- The Application of Linear Polarized X-Rays after Bragg Reflection for X-Ray Fluorescence Analysis..- Trace Analytical Capabilities of Total-Reflection X-Ray Fluorescence Analysis.- Qualitative Analysis of X-Ray Spectra.- K-Edge X-Ray Fluorescence Analysis for Actinide and Heavy Elements Solution Concentration Measurements.- Excitation and Detection of High Energy Chracteristic X-Rays (20–90 KeV) Using a Novel Radiometric Technique.- An Examination of the Overall Stability of an XRF Spectrometer with Special Reference to Fourier Analysis of Temporal Variation.- Evaluation of the New Generation of Dual-Anode X-Ray Tubes.- Comparison of Various X-Ray Tube Types for XRF Analysis.- IV. Recent Developments in Long-Wavelength Spectroscopy.- Reflection Intensity Dependence on Surface and Wavelength from LiF and EDDT Analyzer Crystals.- A SoftX-Ray Experimental Facility.- Wavelength Dispersing Devices for Soft and Ultrasoft X-Ray Spectrometers.- V. Applications of XRF and XRD to Life Sciences and the Environment.- Feasibility Studies of X-Ray Fluorescence as a Method for the In Vivo Determination of Platinum and Other Heavy Metals.- A Fast, Versatile X-Ray Fluorescence Method for Measuring Tin in Impregnated Wood.- Certification of Reference Materials by Energy-Dispersive X-Ray Fluorescence Spectrometry?.- Evaluating the Variability of Southwestern Ceramics with X-Ray Fluorescence.- An XRF Method for the Analysis of Atmospheric Aerosol and Vehicular Particulate Deposits on Filters.- VI. XRF Applications: Mineralogical, General.- Analysis of River Sediments from the Tigre River (Venezuela) by Radioisotope Excited X-Ray Fluorescence.- Energy-Dispersive XRF Analysis of Intact Salt Drill Cores.- The Use of Rapid Quantitative X-Ray Fluorescence Analysis in Paper Manufacturing and Construction Materials Industry.- Analysis of Diatomaceous Earth by X-Ray Fluorescence Techniques.- Fundamental Parameters vs. Multiple Regression Calculations for the Determination of Europium in Oxide Catalyst Supports by XRF.- EDXRF Determination of Major and Minor Elements in Compound Fertilizers.- Analysis of Wet-Process Phosphoric Acid and By-Product Filter Cake by X-Ray Spectrometry.- VII. New Techniques and Instrumentation in XRD.- The Rapid Simultaneous Measurement of Thermal and Structural Data by a Novel DSC/XRD Instrument.- Balanced Filters for an Annular Counter.- X-Ray Diffraction Measurements via a UNIX+ Based System.- TSX-PLUS Multi-Tasking Upgrade for the Nicolet L-11 Powder Diffraction System.- VIII. X-Ray Strain and Stress Determination.- X-Ray Multiaxial Stress Analysis on Materials with Stress Gradient by Use of Cos? Function.- A Practical ?-Method for the Evaluation of Stress on Materials with Stress Gradient by X-Rays.- Residual Stress Measurements in Inconel Alloy 600 Tubing Using an Advanced X-Ray Instrument and Cr K? Radiation.- Determination of the Unstressed Lattice Parameter “ao” for (Triaxial) Residual Stress Determination by X-Rays.- X-Ray Fractographic Approach to Fracture Toughness of AISI 4340 Steel.- Strain Measurements on Single Crystals and Macrograins with the Aid of an Automated Phi-Psi Goniometer.- IX. XRD Search/Match Methods and Quantitative Analysis.- The Quality of X-Ray Diffraction Standards for Phosphate Minerals and the Degree of Success in Computer Identification.- Results of a Round Robin Study of Systematic Errors Found in Routine X-Ray Diffraction Raw Data.- An X-Ray Diffraction Procedure for Measuring Retained Austenite in High Chromium White Cast Iron.- Quantitative X-Ray Analysis of ICPP Simulated High Alumina Calcine.- X. XRD Applications.- High Temperature XRD Studies of Selected Carbonate Minerals.- High Temperature X-Ray Diffraction Studies of the Defluorination Reactions of Chukhrovite, Falphite and Ralstonite.- Low Thermal Expansion of Alkali Zirconium Phosphates Using a Microcomputer Automated Diffractometer.- The Structure and Lattice Parameters of Pentaerythritol Above and Below Its Phase-Transition Temperature.- A Comparison of Detection Systems for Trace Phase Analysis.- X-Ray Diffraction/Electron Microprobe Analysis of Surface Films Formed on Alloys During Hydrothermal Reaction with Geologic Materials.- Determination of the Crystal System of a Neodymium-Iron-Boron Alloy by X-Ray Diffraction.- An X-Ray Diffraction Method for the Determination of Temperatures in Coke Reactions.- Author Index.

巻冊次

v. 31 ISBN 9780306429323

内容説明

The continuing success of the Denver X-Ray Conference is, it seems to me, the consequence of three equally important facets of each meeting. These are: 1) the collegial atmosphere and workshops at which experts and novices mix, talk, and informally share information at many levels; 2) the plenary session at which information is presented that intentionally brings new ideas to attendees to broaden the scope of the field; and 3) the traditional sessions in which interesting reports on current research and applications are presented in a timely and professional way. The first and last of these are discussed separately by Paul Predecki and are organized (no small task!) by the entire advisory board. This requires much more than deciding whether yet another workshop on specimen preparation is needed and whom to prevail upon to organize and present it. In fact, few attendees at these workshops ever appreciate the level of effort that Paul and his staff expend to make sure everything comes off smoothly, even when hundreds of copies of handouts need to be whipped off at the last moment, travel problems arise, or unusual audio­ visual aids are suddenly needed. But my topic here is the second of the three facets listed above - the plenary session. Organizing this falls to a single individual, on the theory that one person can then approach enough others as speakers to put together a unified and yet diverse program of related and interesting review papers.

目次

• I. Microbeam Techniques and Imaging Methods for Materials Characterization.- Microdiffraction with Synchrotron Beams (or Ultra-High Pressure Research).- Microstructural and Chemical Analysis Using Electron Beams: The Analytical Electron Microscope.- X-Ray Imaging of Surface and Internal Structure.- X-Ray Imaging: Status and Trends.- Secondary Ion Mass Spectrometry and Related Techniques.- X-Ray Microscopy using Collimated and Focussed Synchrotron Radiation.- Imaging with Spectroscopic Data.- Small Area X-Ray Diffraction Techniques
• Errors in Strain Measurement.- Elemental and Phase Mapping of Sputtered Binary Plutonium Alloys.- An Automated X-Ray Microfluorescence Materials Analysis System.- Industrial Applications of X-Ray Computed Tomography.- II. Characterization of Thin Films by XRD and XRF.- Correlations Between X-Ray Microstructures and Magnetic Properties of CoCrTa Alloy Thin Films.- Defect Structure of Synthetic Diamond and Related Phases.- Microstructural Characterization of Thin Polycrystalline Films by X-Ray Diffraction.- Automated X-Ray Topography and Rocking Curve Analysis: A reliability Study.- Grazing Incidence X-Ray Scattering Studies of Single Quantum Wells.- Dynamical Theory of Asymmetric X-Ray Diffraction for Strained Crystal Wafers.- Dynamical X-Ray Diffraction Simulations for Asymmetric Reflections for III-V Semiconductors Multilayers.- Simultaneous Determination of the Thickness and Composition of Thin Film Samples using Fundamental Parameters.- III. X-Ray Stress/Strain Determination, Fractography, Diffraction, Line Broadening Analysis.- The Phi-Integral Method for X-Ray Residual Stress Measurements.- Oscillations in Interplanar Spacing vs. Sin2?, A FEM Analysis.- Focusing Circle Errors in X-Ray Residual Stress Measurements of Nickel-BasedMaterials.- Residual Stress Analysis in Steels Having Preferred Orientation by Use of Synchrotron Radiation Source.- Macro and Micro-Stress Distributions in Filled Epoxy Systems.- Residual Stress Determination in Al2O3/SiC (Whisker) Composites by X-Ray Diffraction.- A Comparison of Diffraction Elastic Constants of Steel Measured with X-Rays and Neutrons.- Residual Stress in Two Dental Alloys During Porcelain Application.- Pre-Cracking Technique and Its Application to X-Ray Fractography of Alumina Ceramics.- X-Ray Fractography of Stress Corrosion Cracking in AISI 4340 Steel Under Controlled Electrode Potential.- A New Method for Evaluating X-Ray Diffraction Peak Broadening with Engineering Applications.- X-Ray Line Broadening Study on Shock-Modified Hematite.- IV. Quantitative and Qualitative XRD Phase Analysis.- Problems and Solutions in Quantitative Analysis of Complex Mixtures by X-Ray Powder Diffraction.- Preliminary Results from a Powder Diffraction Data Intensity Round-Robin.- The Estimation of Limits of Detection in RIM Quantitative X-Ray Diffraction Analysis.- Automated Quantitative Multiphase Analysis Using a Focusing Transmission Diffractometer in Conjunction with a Curved Position Sensitive Detector.- X-Ray Diffraction Analysis of Fly Ash.- Measuring Graphitic Carbon and Crystalline Minerals in Coals and Bottom Ashes.- V. X-Ray and Neutron Diffraction Applications Including Superconductors.- High Temperature Stability of Superconducting YBa2Cu3Ox as Characterized by X-ray Diffraction.- X-Ray Study of the BaO-Y2O3-CuOx System.- Comparison of Calculated and Experimental Powder X-Ray Diffraction Patterns of Organic Materials.- Neutron Diffraction — A Probe for Grain Size and Preferred Orientation in Zircaloy-Clad Uranium.- Applications of Pulsed Neutron PowderDiffraction to Actinide Elements.- VI. XRD Techniques, Instrumentation and P.C. Applications.- Asymmetric Crystals Re-Visited.- A 4 Crystal Monochromator for High Resolution Rocking Curves.- Laser Aligned Laue Technique for Small Crystals.- A Novel X-Ray Powder-Diffractometer, Measuring Preferred-Orientations.- Using Digitized X-Ray Powder Diffraction Scans as Input for a New PC-AT Search/Match Program.- PC Based Topography Technique.- VII. XRF Techniques, Instrumentation and Mathematical Models.- X-Ray Fluorescence Analysis of Alloy and Stainless Steels Using a Mercuric Iodide Detector.- X-Ray Fluorescence Spectrometry with Gas Proportional Scintillation Counters.- Advances and Enhancements in Light Element EDXRF.- Window Area Effects in the Detector Efficiency for Source Excited EDXRF Geometries.- A New Analysis Principle for EDXRF: The Monte-Carlo — Library Least-Squares Analysis Principle.- Defining and Deriving Theoretical Influence Coefficients in XRF Spectrometry.- VIII. Synchrotron Radiation and Other Applications of XRF.- Appearance Potential X-Ray Fluorescence Analysis.- Near-Surface Analysis of Semiconductor Using Grazing Incidence X-Ray Fluorescence.- A Scanning X-Ray Fluorescence Microprobe with Synchrotron Radiation.- Correction Method for Particle-Size Effect in XRF Analysis of Ore Slurries.- Intensity and Distribution of Background X-Rays in Wavelength Dispersive Spectrometry.- Author Index.

巻冊次

v. 32 ISBN 9780306432361

内容説明

The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of "What is Synchrotron Radiation?" by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS).

目次

I. High Brilliance Sources/Applications.- Synchrotron Radiation X-Ray Fluorescence Analysis.- X-Ray Diffraction Using Synchrotron Radiation - A Catalysis Perspective.- II. On-Line X-Ray Analysis.- On-Line X-Ray Fluorescence Spectrometer for Coating Thickness Measurements.- Process Control Applications of the Peltier Cooled SI(LI) Detector Based EDXRF Spectrometer.- Application of Fundamental Parameter Software to On-Line XRF Analysis.- On-Stream XRF Measuring System for Ore Slurry Analysis.- Applications of On-Line XRF and XRD Analysis Techniques to Industrial Process Control.- On-Site Tests of a New XRD/XRF On-Line Process Analyzer.- III. Xrf Mathematical Models and Quantitation.- Concepts of Influence Coefficients in XRF Analysis and Calibration.- Painless XRF Analysis Using New Generation Computer Programs.- Intensity and Distribution of Background X-Rays in a Wavelength-Dispersive Spectrometer. II. Applications.- What Can Data Analysis do for X-Ray Microfluorescence Analysis?.- The Determination of Rare Earth Elements in Geological Samples by XRF Using the Proportional Factor Method.- IV. Techniques And XRF Instrumentation.- How to Use the Features of Total Reflection of X-rays for Energy Dispersive XRF.- Applications of a Laboratory X-Ray Microprobe to Materials Analysis.- Development of Instrument Control Software for the SRS/300 Spectrometer on a VAX/730 Computer Running the VMS Operating System.- Instrumentation and Applications for Total Reflection X-Ray Fluorescence Spectrometry.- Micro X-Ray Fluorescence Analysis with Synchrotron Radiation.- X-Ray Microprobe Studies Using Multilayer Focussing Optics.- V. XRF Applications.- Resolution Enhancement for Cu K-alpha Emission of Y-Ba-Cu-O Compounds.- Chemical State Analysis by X-Ray Fluorescence Using Absorption Edges Shifts.- High Resolution X-Ray Fluorescence Si K? Spectra: A Possible New Method for the Determination of Free Silica in Airborne Dusts.- Quantitative Analysis of Fluorine and Oxygen by X-Ray Fluorescence Spectrometry Using a Layered Structure Analyzer.- The Homogeneity of Fe, Sr and Zr in SL-3/Lake Sediment Standard Reference Material by Radioisotope Induced X-Ray Emission..- Quantitative Analysis of Arsenic Element in a Trace of Water Using Total Reflection X-Ray Fluorescence Spectrometry.- Impurity Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence Analysis.- Sample Treatment for TXRF - Requirements and Prospects.- Sample Preparation Optimization for EDXRF Analysis of Portland Cement.- The Viability of XRF Determination of Gold in Mineral Reconnaissance.- An Improved Fusion Technique for Major-Element Rock Analysis by XRF.- Modern Alloy Analysis and Identification with a Portable X-Ray Analyzer.- Low Level Iodine Detection by TXRF Spectrometry.- The Application of P-32 and Sn-113 Radionuclides for the Determination of Noble Metals.- Characterization of Permalloy Thin Films via Variable Sample Exit Angle Ultrasoft X-Ray Fluorescence Spectrometry.- VI. Analysis of Thin Films by XRD and XRF.- X-Ray Diffraction Analysis of High Tc Superconducting Thin Films.- Thickness Measurement of Epitaxical Thin Films by X-Ray Diffraction Method.- Texture Analysis of Thin Films and Surface Layers by Low Incidence Angle X-Ray Diffraction.- Fast Thickness Measurement of Thin Crystalline Layers by Relative Intensities in XRPD Method.- X-Ray Diffraction of Thin Oxide Films on Soldered Module Pins.- X-Ray Diffraction Studies of Polycrystalline Thin Films Using Glancing Angle Diffractometry.- Density Measurement of Thin Sputtered Carbon Films.- Determination of Ultra-Thin Carbon Coating Thickness by X-Ray Fluorescence Technique.- VII. X-Ray Stress Analysis.- Separation of the Macro- and Micro-Stresses in Plastically Deformed 1080 Steel.- Effect of Plastic Deformation on Oscillations in "d" vs. Sin2? Plots A FEM Analysis.- X-Ray Diffractometric Determination of Lattice Misfit Between ? and ?' Phases in Ni-Base Superalloys - Conventional X-Ray Source vs. Synchrotron Radiation.- Standard Deviations in X-Ray Stress and Elastic Constants Due to Counting Statistics.- Elastic Constants of Alloys Measured with Neutron Diffraction.- Stress Measurements with a Two-Dimensional Real-Time System.- Application of a New Solid State X-Ray Camera to Stress Measurement.- Advantages of the Vector Method to Study the Texture of Well-Textured Thin Layers.- Taking into Account the Texture Effect in the Measurement of Residual Stresses by Using the Vector Method of Texture Analysis.- X-Ray Diffraction Studies on Shock-Modified Y Ba2Cu3O7 Superconductors.- The Characterization of a Solid Sorbent with Crystallite Size and Strain Data from X-Ray Diffraction Line Broadening.- X-Ray Measurement of Grinding Residual Stress in Alumina Ceramics.- Residual Stresses Near SCC Fracture Surfaces of AISI 4340 Steel.- Residual Stress Measurement of Silicon Nitride and Silicon Carbide by X-Ray Diffraction Using Gaussian Curve Method.- Residual Stresses in Al2CO3/SiC (Whisker) Composites Containing Interfacial Carbon Films.- VIII. Applications of Digitized XRD Patterns.- Parallel Beam and Focusing Powder Diffractometry.- Chemical Constraints in Quantitative X-Ray Powder Diffraction for Mineral Analysis of the Sand/Silt Fractions of Sedimentary Rocks.- The Crystal Structures of the Cubic and Tetragonal Phases of Y1Ba3Cu2O6.5 + ?.- Using X-Ray Powder Diffraction to Determine the Structure of VPI-5 - A Molecular Sieve with the Largest Known Pores.- Optimizing the Calculation of Standardless Quantitative Analysis.- Shadow: A System for X-Ray Powder Diffraction Pattern Analysis.- IX. Qualitative and Quantitative Phase Analysis Diffraction Applications.- Specific Data Handling Techniques and New Enhancements in a Search/Match Program.- Use of the Crystal Data File on CD-ROM.- A Reference Database Retrieval System: Information as a Tool to Assist in XRD Phase Identification.- On the Selection of the Value for the Experimental Wavelength in Powder Diffraction Measurements.- Results of the JCPDS-ICDD Intensity Round Robin.- On the Preparation of Good Quality X-Ray Powder Patterns.- Semi-Quantitative XRD Analysis of Fly Ash Using Rutile as an Internal Standard.- Mechanically-Induced Phase Transformations in Plutonium Alloys.- The Determination of ?-Cristobalite in Airborne Dust by X-Ray Diffraction - Theory and Practice.- Automatic Computer Measurement of Selected Area Electron Diffraction Patterns from Asbestos Minerals.- Comparison of Experimental Techniques to Improve Peak to Background Ratios in X-Ray Powder Diffractometry.- X-Ray Diffraction Studies of Solid Solutions of Pentaglycerine-Neopentylglycol.- Simultaneous Thermal and Structural Measurements of Oriented Polymers by DSC/XRD Using an Area Detector.- Vacuum Free-Fall Method for Preparation of Randomly Oriented XRD Samples.- X. X-Ray Tomography, Imaging, and Topography.- Applications of Dual-Energy X-Ray Computed Tomography to Structural Ceramics.- Microtomography Detector Design: It's Not Just Resolution.- Required Corrections for Analysis of Industrial Samples with Medical CT Scanners.- LM-ACT for Imaging RAM Devices in X-Ray Diffraction Topographs.- Author Index.

巻冊次

v. 33 ISBN 9780306436154

内容説明

The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates emphasis between x-ray diffraction and x-ray fluorescence, and this being an odd year the emphasis was on diffraction. Thus the Plenary Session was slanted toward diffraction in general and thin film analysis in particular. The Plenary Session on x-ray analysis of thin films did not just happen this year but really began four years ago with Paul Predecki suggesting a special session devoted to thin film techniques. The session generated a great deal of interest, so Paul suggested that a workshop on thin films should be slated for the 1987 conference. A full day was devoted to the workshop, which was split into a half day on epitaxial thin films and the other half day on polycrystalline thin films. The workshop attendance indicated a great deal of interest in this topic, leading to this year's Plenary Session. The first two speakers of the Plenary Session (B. Tanner and K. Bowen) have been key throughout the thin film activities. They were invited speakers for the 1985 special session on thin films and instructors for the 1987 workshop on epitaxial thin films.

目次

I. Characterization of Epitaxial Thin Films and Crystal Defects by X-Ray Diffraction.- II. XRD Characterization of Polycrystalline Thin Films.- III. X-Ray Spectrometric Characterization of Thin Films.- IV. Analysis of Digital Diffraction Data Including Rietveld.- V. X-Ray Stress Analysis.- VI. Determination of Crystallite Size and Strain.- VII. Phase Identification, Structural and Quantitative Analysis by Diffraction.- VIII. X-Ray Spectrometry Data Analysis.- IX. XRF Instrumentation.- X. XRF Techniques for Hazardous Wastes and Other Applications.- Author Index.

巻冊次

v. 34 ISBN 9780306440038

内容説明

The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The "Denver Conference" is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop­ ments. In recent years there has been a steady expansion of applications of x-ray analysis to characterize surfaces and thin films. To introduce the audience to one of the exciting and important new developments in x-ray fluorescence, the topic for the Plenary Session of the 1990 Conference was: "Surface and Near-Surface X-Ray Spectroscopy. " The Conference had the privilege of inviting five leading world experts in the field of x-ray spectroscopy to deliver lectures at the Plenary Session. The first two lectures were on total-reflection x-ray fluorescence spectrometry. Professor P. Wobrauschek of Austria reviewed "Recent Developments and Results in Total-Reflection X-Ray Fluorescence. " Trends and applications of the technique were also discussed. Dr. T. Arai of Japan reported on "Surface and Near-Surface Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence. " He emphasized the importance of using proper x-ray optics to achieve high signal-to-noise ratios. A mathematical model relating the x-ray intensity to the depth of x-ray penetration was also described.

目次

Recent Developments and Results in Total Reflection X-Ray Fluorescence Analysis.- Glancing Angle X-Ray Absorption Spectroscopy.- Semiconductor Surface Characterization by Synchrotron X-Ray Fluorescence Analysis.- Total-Reflection X-Ray Fluorescence of Thin Layers on and in Solids.- Trace Element Analysis of Solutions at the PPB Level.- Trace Analysis Using Eds: Applications to Thin-Film and Heterogeneous Samples.- Grazing Incidence X-Ray Fluorescence Analysis with Monochromatic Radiation.- Impurity Analysis on Si Wafer Using Monochro-Trex.- Chemical State Analysis by Soft X-Ray Emission Spectra with Molecular-Orbital Calculations.- Fundamentals of X-Ray Spectrometric Analysis Using Low-Energy Electron Excitation.- Chemical Bonding Studies of Solutions by High Resolution X-Ray Fluorescence Spectroscopy.- Advances in Boron Measurement with Wavelength Dispersive XRF.- Soft and Ultra-Soft X-Ray Spectrometry Using Long-Wavelength Dispersive Devices.- Requirement Analysis and Preliminary Design For Energy Dispersive X-Ray Fluorescence Analysis Software.- Quantitative XRF Analysis Using the Fundamental Algorithm.- Practical Application for the use of Statistics to Establish Quality Control and Implement Quality Assurance in X-Ray Fluorescence.- Drift in Energy Calibration of Energy Dispersive X-Ray Fluorescence Analyzers and Its Correction.- Current and Future Energy Dispersive Exafs Detector Systems.- High Throughput Rate Solid State Detector Systems for Fluorescence EXAFS.- A Review of the Relative Merits of Low Powered WDXRF EDXRF Spectrometers for Routine Quantitative Analysis.- Imaging XPS. A Contribution to 3D X-Ray Analysis.- Graphite Fusion of Geological Samples.- Fast, High-Resolution X-Ray Microfluorescence Imaging.- High-Temperature Displacement Measurement using AScanning Focussed X-Ray Line Source.- On-Belt Determination of Calcium Concentration by X-Ray Fluorescence.- Niobium Concentration Measurement in Steel Samples with TXRF.- Mass Absorption Coefficient Determination using Compton Scattered Tube Radiation: Applications, Limitations and Pitfalls.- Trace Element Analysis of Rocks by X-Ray Spectrometry.- X-Ray Fluorescence and Fire-Assay Collection: Useful Partners in the Determination of the Platinum-Group Elements.- X-Ray Fluorescence Analysis of High-Density Brines using a Compton Scattering Ratio Technique.- Secondary Target X-Ray Excitation in Vivo Measurement of Lead in Bone.- Phosphorus Determination in Borophosphosilicate or Phosphosilicate Glass Films on a Si Wafer by Wavelength Dispersive X-Ray Spectroscopy.- Non-Destructive Analysis of Venezuelan Artifacts of Different Sizes and Shapes for Provenance Studies.- X-Ray Fluorescence as a Problem-Solving Tool in the Paper Industry.- X-Ray Detectors: Pulse Height Shifts, Escape Peaks and Counting Losses.- Measurement of Mass Absorption Coefficients using Compton-Scattered Cu Radiation in X-Ray Diffraction Analysis.- Evaluation of the X-Ray Response of a Position-Sensitive Microstrip Detector with An Integrated Readout Chip.- Practical and “Unusual” Applications in X-Ray Diffraction using Position Sensitive Detectors.- CCD Based X-Ray Detectors.- Wide Angle and Small Angle X-Ray Scattering Applications using a Two-Dimensional Area Detector.- Evaluation of Reference X-Ray Diffraction Patterns in the Icdd Powder Diffraction File.- Matchdb—A Program for the Identification of Phases using a Digitized Diffraction-Pattern Database.- X-Ray Diffraction Analysis of Fly Ash. II. Results.- Development of a Calibration Method for Quantitative X-Ray Powder Diffraction ofSize-Segregated Aerosols.- Strategies for Preferred Orientation Corrections in X-Ray Powder Diffraction using Line Intensity Ratios.- Quantification of Carbamazepine in Tablets by Powder X-Ray Diffractometry.- Mass Absorption Corrected X-Ray Diffraction Analysis of Entrained-Flow Reactor Coal Combustion Products.- A Focusing System for X-Ray Diffraction Studies of Materials Under High Pressure in the Diamond Cell.- Phase Analysis of Metallic Plutonium-Containing Fuel Alloys using Neutron Diffraction.- High-Temperature XRD Analysis of Polymers.- Residual Strains in Al2O3/Sic (Whisker) Composite From 25-1000°C.- Applications of X-Ray Diffraction Crystallite Size/Strain Analysis to Seismosaurus Dinosaur Bone.- The Substructure of Austenite and Martensite Through a Carburized Surface.- Determination of Lattice Parameter and Strain of ? Phases in Nickel-Base Superalloys by Synchrotron Radiation Parallel Beam Diffractometry.- The Effect of Satellite Lines From the X-Ray Source on X-Ray Diffraction Peaks.- X-Ray Topography and Tem Study of Crystal Defect Propagation in Epitaxially Grown Algaas Layers on Gaas(001).- Lineshape Analysis of X-Ray Diffraction Profiles: Polyethylene and Model Copolymers.- Double-Crystal X-Ray Diffraction Studies of Si Ion-Implanted and Pulsed Laser-Annealed Gaas.- X-Ray Characterization of Thin Diamond Films Deposited by Hot-Filament Chemical Vapor Deposition.- Substructure-Magnetic Property Correlation in Fe/Ag Composite Thin Films.- The Thickness Measurements of Thin Bulk Film by X-Ray Method.- Oxygen Concentration Determination in Silicon Single Crystals by Precision Lattice Parameter Measurement.- Thermal Stress Relaxation in Vapor Deposited Thin Films.- An Expert System for the Validation and Interpretation of X-Ray Residual Stress Data.-Residual Stresses in Railroad Car Wheels.- Measurement of Residual Stresses by X-Ray Diffraction Near Simulated Heat Affected Zones in Austenitic Stainless Steels.- Use of X-Ray Diffraction using Gaussian Curve Method for Measuring Plastic Strain of Steels.- X-Ray Elastic Constants For ?-SiC and Residual Stress Anisotropy in a Hot-Pressed Al2O3/SiC (Whisker) Composite.- X-Ray Study on Fatigue Fracture Surfaces of Aluminum Alloy Reinforced with Silicon Carbide Whiskers.- Residual Stress Analysis of Silicon Nitride to Carbon Steel Joint.- Residual Stresses in Unidirectional Al2O3 Fiber/Silicate Glass Composites by X-Ray Diffraction.- X-Ray Residual Stress Measurement of Ground Surface of Metal-Ceramic Composite.- Determination of X-Ray Elastic Constants in a Ti-14Al-21Nb Alloy and a Ti-14Al-21Nb/Sic Metal Matrix Composite.- A Method for X-Ray Stress Analysis of Thin Films and Its Application to Zinc-Nickel-Alloy Electroplated Steel.- Fracture Analysis of Nodular Cast Iron by X-Ray Fractography.- X-Ray Fractographic Study on Alumina and Zirconia Ceramics.- Author Index.

巻冊次

v. 35B ISBN 9780306442490

目次

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

巻冊次

v. 36 ISBN 9780306445712

内容説明

Proceedings of the 41st Annual Conference on Applications of X-ray Analysis, held at Colorado Springs, Colorado in August 1992. The volume is divided into ten sections: mathematical techniques in x-ray spectrometry; analysis of light elements by x-ray spectrometry; XRS techniques and instrumentation

巻冊次

v. 37 ISBN 9780306449017

内容説明

Selected papers from the 1993 Denver Conference on Applications of X-Ray Analysis. International experts present the latest research in the field, with special coverage of the impact of personal computers and sophisticated software on the development of X-ray instrumentation and techniques. Annotati

巻冊次

v. 38 ISBN 9780306450457

内容説明

The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. The Denver X-Ray Conference has evolved from the 1950's into an international forum for the interaction of scientists, engineers and technologists interested in the use of x-rays in materials characterization. It has not only acted as a venue but has both stimulated and nurtured many of the principal developments in this field over the years. The major changes that have been occurring on the national and international scene as a result of the end of the cold war have dramatic-ally affected the way the materials community does business. The removal of defense priorities and development funds from most new materials initiatives has stimulated the char acterization communities to look to increasing the speed of their methods. This is being accom plished via the development of very fast dynamic characterization procedures which can rapidly and intelligently monitor and optimize the formation of a desired microstructure. The develop ment of intelligent characterization procedures applied in real-time during the manufacturing process can lead to the ability to design desired microstructures. Another potential advantage to this approach is its ability to characterize the actual amount of material which goes into a final product; permitting a rapid transition from R&D to manufacturing by avoiding the prob lems associated with scale-up.

目次

Accurate Modeling of Size and Strain Broadening in the Rietveld Refinement: The 'DoubleVoigt' Approach (D. Balzar). In vivo Xray Fluorescence of Lead and Other Toxic Trace Elements (D.R. Chettle). Xray Diffraction Analysis of PM10 Aerosols Extracted by Ultrasound (B.L. Davis, H. Chen). Total Electron Yield (TEY): A New Approach for Quantitative Xray Analysis (H. Ebel). Manufacture and Use of Setting Up Samples (F.R. Feret). Applied Crystallography in the Scanning Electron Microscope Using a CCD Detector (R.P. Goehner, J.R. Michael). Trace Analysis by TXRF (R.S. Hockett). An in situ XRD Technique for Annealing Investigations (D.E. Hoylman, S.C. Axtell). Adaptation of the EGS4 Monte Carlo Code for the Design of a Polarized Source for Xray Fluorescence Analysis of Platinum and Other Heavy Metals in vivo (D.G. Lewis). 3D Graphing of XRF Matrix Correction Equations (A.J. Klimasara). Environmental Factors Contributing to the Body Burden of Lead as Determined by in vivo Xray Fluorescence (S.J.S. Ryde). Investigation of Residual Stresses in a Sleeve Coldworked Lug Specimen by Neutron and Xray Diffraction (R. Lin). Picosecond Xray Diffraction: System and Applications (P.M. Rentzepis). The Characterization of Microtexture by Orientation Mapping (R.A. Schwarzer). 79 additional articles. Index.

巻冊次

v. 39 ISBN 9780306458033

内容説明

The 39th Denver Conference on Applications of X-ray Analysis was held July 31-August 4, 1995, at the Sheraton Hotel, Colorado Springs, Colorado. The year 1995 was a special year for the X-ray analysis community, since it represented the 100th anniversary ofthe discovery ofX-rays by Wilhelm Roentgen. In commemoration of this event, the Plenary Session of the conference was entitled "THE ROENTGEN COMMEMORATIVE SESSION:1895-1995, "100 YEARS OF PROGRESS IN X-RA Y SCIENCE AND APPLICATIONS". It is interesting to note that while we celebrate 100 years ofthe use ofX-ray techniques in general, and about 80 years ofX-ray diffraction and spectroscopy in particular, the Denver X-ray Conference has been in place for about half ofthat time period! Like the X-ray methods it represents, the Denver Conference on Applications ofX-ray Analysis has grown and matured, has survived the rigors oftime, and today, provides the worlds' best annual forum for the exchange of experiences and developments in the various fields ofX-ray analysis. Imagine, when the Denver Conference started in 1951, there were no personal computer- in fact, there were no computers, period! There was no SEM, no microprobe, there were no Si(Li) detectors, no transistors, no synchrotrons, Hugo Rietveld was a child, and many members who regularly attend Denver Meetings today, weren't even born yet! As I write this foreword, a copy of volurne 1 of Advances in X-ray Analysis lays in front of me on my desk.

目次

• Historical Reviews of X-Ray Science and Technology: The Early Years of X-Ray Diffraction and X-Ray Spectrometry
• J.L. de Vries. Conditoning of X-Ray Beams and Other Developments in X-Ray Instrumentation: Application of Graded Multilayer Optics in X-Ray Diffraction
• M. Schuster, H. Gobel. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis: Actual Tasks of Stress Analysis by Diffraction
• V. Hauk. Characterization of Polymers, Amorphous Materials and Organics by X-Ray Neutron Scattering: Analysis of X-Ray Diffraction Scans of Poorly Crystallized Semicrystalline Polymers
• N.S. Murthy. Precision, Accuracy in XRD, Phase Analysis: Results of X-Ray Powder Diffraction Round Robin Tests with Corundum Plates and Powder Samples
• V. Valvoda, et al. Characterization of Thin Films by X-Ray Diffraction and Fluorescence: Inhomogeneous Deformation in Thin Films
• I.C. Noyan, C.C. Goldsmith. Other Applications of X-Ray Diffractions Including High-Temperature and Nonambient: Total Reflection XRF and Trace Analysis: Quantitative ZRF Data Interpretation and Other XRF Applications. 95 Additional Articles. Index.

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詳細情報

• NII書誌ID(NCID): BA01581773
• ISBN:
  • 0306419394
  • 0306429322
  • 0306432366
  • 0306436159
  • 0306440032
  • 0306442493
  • 0306442493
  • 0306445719
  • 0306449013
  • 0306450453
  • 0306458039
• LCCN: 58035928
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: v.
• 大きさ: 26 cm