Symposium on X-ray and electron probe analysis : presented at the Sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963

著者

• American Society for Testing and Materials

書誌事項

Symposium on X-ray and electron probe analysis : presented at the Sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963

（ASTM special technical publication, No. 349）

ASTM, 1964

詳細情報

• NII書誌ID(NCID): BA01667686
• LCCN: 64021661
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Philadelphia
• ページ数/冊数: vi, 209 p.
• 大きさ: 24 cm
• 親書誌ID:
  • BA00068096