Advanced photon and particle techniques for the characterization of defects in solids : symposium held November 27-29, 1984, Boston, Massachusetts, U.S.A.

著者

• Roberto, J. B.
• Carpenter, R. W.
• Wittels, M. C.
• Materials Research Society
• Symposium on Advanced Photon and Particle Techniques for the Characterization of Defects in Solids

書誌事項

Advanced photon and particle techniques for the characterization of defects in solids : symposium held November 27-29, 1984, Boston, Massachusetts, U.S.A.

editors, J.B. Roberto, R.W. Carpenter, M.C. Wittels

（Materials Research Society symposium proceedings, v. 41）

Materials Research Society, c1985

注記

Includes bibliography and index

詳細情報

• NII書誌ID(NCID): BA02695687
• ISBN:
  • 0931837065
• LCCN: 85005061
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pittsburgh
• ページ数/冊数: xi, 390 p.
• 大きさ: 24 cm
• 分類:
  • LCC : QD921
  • DC19 : 620.1/127
• 件名:
  • LCSH : Crystals - Defects - Congresses
  • LCSH : Electron microscopy - Congresses
  • LCSH : Proton beams - Congresses
  • LCSH : Particle beams - Congresses
• 親書誌ID:
  • BA00013775