Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970

Author(s)

• Symposium on Applications of Electron Microfractography to Materials Research
• American Society for Testing and Materials. Subcommittee II on Fractography

Bibliographic Information

Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970

（ASTM special technical publication, 493）

American Society for Testing and Materials, c1971

Note

Sponsored by ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E-24 on Fracture Testing of Metals

Includes bibliographical references

Details

• NCID: BA02962433
• LCCN: 70155959
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Philadelphia
• Pages/Volumes: 96 p.
• Size: 23 cm
• Classification:
  • LCC : TA460
  • DC : 620.1/6/6028
• Subject Headings:
  • LCSH : Fractography -- Congresses
  • LCSH : Electron microscope -- Congresses
• Parent Bibliography ID:
  • BA00068096