Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970

著者

• Symposium on Applications of Electron Microfractography to Materials Research
• American Society for Testing and Materials. Subcommittee II on Fractography

書誌事項

Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970

（ASTM special technical publication, 493）

American Society for Testing and Materials, c1971

注記

Sponsored by ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E-24 on Fracture Testing of Metals

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA02962433
• LCCN: 70155959
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Philadelphia
• ページ数/冊数: 96 p.
• 大きさ: 23 cm
• 分類:
  • LCC : TA460
  • DC : 620.1/6/6028
• 件名:
  • LCSH : Fractography -- Congresses
  • LCSH : Electron microscope -- Congresses
• 親書誌ID:
  • BA00068096