Lifetime factors in silicon : a symposium

著者

• Westbrook, R. D.
• American Society for Testing and Materials. Committee F-1 on Electronics

書誌事項

Lifetime factors in silicon : a symposium

sponsored by ASTM Committee F-1 on Electronics, American Society for Testing and Materials, San Diego, Calif., 15-16 Feb., 1979 ; R.D. Westbrook, symposium chairman

（ASTM special technical publication, 712）

The Society, c1980

注記

"04-712000-46."

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA02976347
• LCCN: 79057525
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Philadelphia, Pa.
• ページ数/冊数: 250 p.
• 大きさ: 24 cm
• 分類:
  • LCC : QC611.8.S5
  • DC19 : 621.3815/2/028
• 件名:
  • LCSH : Silicon -- Electric properties -- Congresses
  • LCSH : Semiconductors -- Congresses
• 親書誌ID:
  • BA00068096