Ion beam handbook for material analysis
Author(s)
Bibliographic Information
Ion beam handbook for material analysis
Academic Press, 1977
Available at 25 libraries
  Aomori
  Iwate
  Miyagi
  Akita
  Yamagata
  Fukushima
  Ibaraki
  Tochigi
  Gunma
  Saitama
  Chiba
  Tokyo
  Kanagawa
  Niigata
  Toyama
  Ishikawa
  Fukui
  Yamanashi
  Nagano
  Gifu
  Shizuoka
  Aichi
  Mie
  Shiga
  Kyoto
  Osaka
  Hyogo
  Nara
  Wakayama
  Tottori
  Shimane
  Okayama
  Hiroshima
  Yamaguchi
  Tokushima
  Kagawa
  Ehime
  Kochi
  Fukuoka
  Saga
  Nagasaki
  Kumamoto
  Oita
  Miyazaki
  Kagoshima
  Okinawa
  Korea
  China
  Thailand
  United Kingdom
  Germany
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  France
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  United States of America
Note
Includes bibliographies and index
Description and Table of Contents
Description
Ion Beam Handbook for Material Analysis emerged from the U.S.-Italy Seminar on Ion Beam Analysis of Near Surface Regions held at the Baia-Verde Hotel, Catania, June 17-20, 1974. The seminar was sponsored by the National Science Foundation and the Consiglio Nazionale delle Ricerche under the United States-Italy Cooperative Science Program. The book provides a useful collection of tables, graphs, and formulas for those involved in ion beam analysis. These tables, graphs, and formulas are divided into five chapters that cover the following topics: energy loss and energy straggling; backscattering spectrometry; channeling; applications of ion-induced nuclear reactions; and the use of ion-induced X-ray yields.
Table of Contents
Chapter Editors and Contributors Preface Table A. Crystal Structure and Density of the Elements Table B. Elements: Isotope Mass, Abundance, and Atomic Weight and Density Table C. Physical Constants and Conversion Factors 1. Energy Loss and Energy Straggling 1.1 Introduction 1.2 Energy Loss 1.3 Energy Straggling 1.4 Additivity Rules of Energy Loss and Energy Straggling 1.5 References Table 1.1 4He Stopping Cross Sections Table 1.2 Energy Straggling Calculated for 4He Ions in Each Element 2. Backscattering Spectrometry Table 2.1 1H Backscattering Kinematic Factor Table 2.2 4He Backscattering Kinematic Factor Table 2.3 1.0 MeV H+ Effective Scattering Cross Section Table 2.4 1.0 MeV 4He++ Effective Scattering Cross Section 2.1 Backscattering Kinematic Factor 2.2 Differential Scattering Cross Section 2.3 Depth Scale 2.4 Depth Scale in Atoms per cm2 2.5 Backscattering Yield from Bulk Targets 2.6 Applications to Elemental Targets 2.7 Applications to Compound Targets 2.8 Analysis of Mixtures 2.9 References3. Channeling 3.1 Introduction 3.2 Axial and Planar Half Angles 3.3 Estimates of Minimum Yield 3.4 Critical Angle and Minimum Yield (Diatomic Compounds) 3.5 Procedure for Obtaining a Random Spectrum 3.6 Crystal Overlaid with an Amorphous Layer 3.7 Disorder Evaluation (Surface Approximation) 3.8 Disorder Evaluation (General Case) 3.9 Lattice Location of Impurities 3.10 Alignment Procedures 3.11 References 3.12 Appendix 4. Selected Low Energy Nuclear Reaction Data 4.1 Introduction 4.2 Table of Most Used Reactions for Light Particle Detection 4.3 Table of Reactions for Profiling H and He Isotopes 4.4 Energy and Angular Dependence of Reaction Cross Sections with Notes for Analysis 4.5 Neutron Reactions 4.6 Elastic Scattering Cross Sections 4.7 (p, ?) Resonances 4.8 Kinematics 4.9 Miscellaneous 4.10 Examples 5. Ion Induced X-Rays 5.1 Introduction 5.2 Techniques 5.3 X-Ray Energies, Wavelengths, and Relative Intensities 5.4 Ion-Induced Ionization Cross Sections 5.5 Fluorescence Yield 5.6 AttenuationIndex
by "Nielsen BookData"