Developments in integrated circuit testing

Author(s)

• Miller, D. M.

Bibliographic Information

Developments in integrated circuit testing

D.M. Miller, editor

（Perspectives in computing, v. 18）

Academic Press, 1987

Note

Includes bibliography and index

• NCID: BA03599000
• ISBN:
  • 0124967353
• Country Code: uk
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: London
• Pages/Volumes: x, 440 p.
• Size: 24 cm
• Classification:
  • LCC : TK7874
  • DC19 : 621.381/71
• Subject Headings:
  • PRECIS : Digital integrated circuits. Testing
  • LCSH : Digital integrated circuits -- Testing
• Parent Bibliography ID:
  • BA00505463