Defects and properties of semiconductors : defect engineering

著者

• Chikawa, J. (Junichi)
• Sumino, K. (Kōji)
• Wada, K. (Kazumi)
• Symposium on "Defects and Qualities of Semiconductors" (1984 : Tokyo, Japan)
• Society of Non-Traditional Technology (Japan)

書誌事項

Defects and properties of semiconductors : defect engineering

edited by J. Chikawa, K. Sumino, and K. Wada

（Advances in solid state technology）

KTK Scientific , D. Reidel , Distributed in the U.S.A. and Canada by Kluwer Academic, c1987

注記

Includes bibliographies and index

"Papers presented at the Symposium on "Defects and Qualities of Semiconductors" which was held in Tokyo on May 17-18, 1984 under the sponsorship of the Society of Non-Traditional Technology"--Pref

詳細情報

• NII書誌ID(NCID): BA0364350X
• ISBN:
  • 9027723524
• LCCN: 86021992
• 出版国コード: ja
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Tokyo,Dordrecht ; Boston,Norwell, MA, U.S.A.
• ページ数/冊数: vi, 261 p.
• 大きさ: 24 cm
• 分類:
  • LCC : QC611.6.D4
  • DC19 : 621.3815/2
• 件名:
  • LCSH : Semiconductors -- Defects -- Congresses
• 親書誌ID:
  • BA03643532