Failure mechanisms in semiconductor devices
著者
書誌事項
Failure mechanisms in semiconductor devices
Wiley, c1987
大学図書館所蔵 件 / 全15件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
Bibliography: p. 179-195
Includes indexes
内容説明・目次
内容説明
A straightforward and accessible approach to the subject of failure in electronic components, centering largely around semiconductor devices. The authors have drawn on their considerable experience in this field to produce an authoritative work which identifies possible sources of failure in semiconductor devices and discusses methods for the detection and elimination of the same. The physics of failure mechanisms are covered in detail, from the semiconductor die itself to its packaging and interconnections. Other topics covered include accelerated lifetesting, reliability modelling and estimating, assurance and screening techniques.
目次
- Introduction
- Reliability Theory
- Failure Mechanisms
- Failure Mechanisms and Device Technologies
- Packaging
- Screening
- Accelerated Testing
- Physical Failure Analysis Techniques
- Reliability Prediction and Failure Modelling
- Quality Assurance
- Conclusions.
「Nielsen BookData」 より