Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.

著者

• Johnson, Noble M.
• Bishop, Stephen G.
• Watkins, George D.
• Materials Research Society
• Materials Research Society. Meeting
• Symposium on Microscopic Identification of Electronic Defects in Semiconductors

書誌事項

Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.

editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins

（Materials Research Society symposium proceedings, v. 46）

Materials Research Society, c1985

注記

Includes bibliographies and indexes

詳細情報

• NII書誌ID(NCID): BA03908080
• ISBN:
  • 0931837111
• LCCN: 85019753
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pittsburgh, Pa.
• ページ数/冊数: xv, 604 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TK7871.85
  • DC19 : 621.3815/2
• 件名:
  • LCSH : Semiconductors -- Defects -- Congresses
  • LCSH : Microscope and microscopy -- Congresses
• 親書誌ID:
  • BA00013775