Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.

著者

• Johnson, Noble M.
• Bishop, Stephen G.
• Watkins, George D.
• Materials Research Society
• Materials Research Society. Meeting
• Symposium on Microscopic Identification of Electronic Defects in Semiconductors

書誌事項

Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.

editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins

（Materials Research Society symposium proceedings, v. 46）

Materials Research Society, c1985

注記

Includes bibliographies and indexes

• NII書誌ID(NCID): BA03908080
• ISBN:
  • 0931837111
• LCCN: 85019753
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pittsburgh, Pa.
• ページ数/冊数: xv, 604 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TK7871.85
  • DC19 : 621.3815/2
• 件名:
  • LCSH : Semiconductors -- Defects -- Congresses
  • LCSH : Microscope and microscopy -- Congresses
• 親書誌ID:
  • BA00013775