Applied materials characterization : symposium held April 15-18, 1985, San Francisco, California, U.S.A.

著者

• Katz, W. (William)
• Williams, P. (Peter)
• Materials Research Society
• Materials Research Society. Meeting
• Symposium on "Applied Materials Characterization"

書誌事項

Applied materials characterization : symposium held April 15-18, 1985, San Francisco, California, U.S.A.

editors, W. Katz, P. Williams

（Materials Research Society symposium proceedings, v. 48）

Materials Research Society, c1985

注記

Includes bibliographies and indexes

• NII書誌ID(NCID): BA03908568
• ISBN:
  • 0931837138
• LCCN: 85025936
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pittsburgh, Pa.
• ページ数/冊数: xiii, 483 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TA410
  • DC19 : 620.1/1/0287
• 件名:
  • LCSH : Materials -- Testing -- Congresses
  • LCSH : Materials -- Analysis -- Congresses
• 親書誌ID:
  • BA00013775