Yield modelling and defect tolerance in VLSI : papers presented at the International Workshop on Designing for Yield, Oxford, 1-3 July 1987

Author(s)

• Moore, Will
• Maly, W.
• Strojwas, Andrzej J.

Bibliographic Information

Yield modelling and defect tolerance in VLSI : papers presented at the International Workshop on Designing for Yield, Oxford, 1-3 July 1987

edited by Will Moore, Wojciech Maly, and Andrzej Strojwas

A. Hilger, c1988

Note

Includes bibliographies and index

Details

• NCID: BA03911096
• ISBN:
  • 085274398X
• LCCN: 88014068
• Country Code: uk
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bristol ; Philadelphia
• Pages/Volumes: vi, 282 p. ill.
• Size: 24 cm
• Classification:
  • LCC : TK7874
  • DC19 : 621.381/73
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Design and construction -- Congresses