Yield modelling and defect tolerance in VLSI : papers presented at the International Workshop on Designing for Yield, Oxford, 1-3 July 1987

著者

• Moore, Will
• Maly, W.
• Strojwas, Andrzej J.

書誌事項

Yield modelling and defect tolerance in VLSI : papers presented at the International Workshop on Designing for Yield, Oxford, 1-3 July 1987

edited by Will Moore, Wojciech Maly, and Andrzej Strojwas

A. Hilger, c1988

注記

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA03911096
• ISBN:
  • 085274398X
• LCCN: 88014068
• 出版国コード: uk
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bristol ; Philadelphia
• ページ数/冊数: vi, 282 p. ill.
• 大きさ: 24 cm
• 分類:
  • LCC : TK7874
  • DC19 : 621.381/73
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Design and construction -- Congresses