Defect recognition and image processing in III-V compounds, II : proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Monterey, California, April 27-29, 1987

Author(s)

• International Symposium on Defect Recognition and Image Processing in III-V Compounds
• Weber, Eicke R.

Bibliographic Information

Defect recognition and image processing in III-V compounds, II : proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Monterey, California, April 27-29, 1987

edited by Eicke R. Weber

（Materials science monographs, 44）

Elsevier, 1987

Note

Includes bibliographies and index

Details

• NCID: BA04031349
• ISBN:
  • 0444428925
• LCCN: 87027177
• Country Code: ne
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Amsterdam ; Tokyo
• Pages/Volumes: x, 320 p.
• Size: 25 cm
• Classification:
  • LCC : TK7871.85
  • DC19 : 621.3815/2
• Subject Headings:
  • LCSH : Semiconductors -- Defects -- Congresses
  • LCSH : Gallium arsenide -- Congresses
  • LCSH : Image processing -- Congresses
• Parent Bibliography ID:
  • BA00014483