Symposium on microscopy : presented at the sixty-second annual meeting, American Society for Testing Materials, Atlantic City, N.J., June 25-26, 1959

著者

• American Society for Testing Materials

書誌事項

Symposium on microscopy : presented at the sixty-second annual meeting, American Society for Testing Materials, Atlantic City, N.J., June 25-26, 1959

（ASTM special technical publication, no. 257）（Sixty-second annual meeting papers）

A.S.T.M., c1959

• NII書誌ID(NCID): BA04288709
• LCCN: 59015654
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Philadelphia
• ページ数/冊数: 165 p.
• 大きさ: 24 cm
• 親書誌ID:
  • BA00068096
  • BA04277338