Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C.

著者

• International Test Conference
• IEEE Computer Society
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C.

sponsored by the IEEE Computer Society, IEEE Philadelphia Section

Computer Society Press of the IEEE , Order from Computer Society of the IEEE, c1987

• pbk.
• microfiche
• case

注記

"IEEE catalog no. 87CH2347-2."

"Computer Society order no. 789."

Includes bibliographies and index

"87CH2437-2"--Spine

詳細情報

• NII書誌ID(NCID): BA04374582
• ISBN:
  • 081860798X
  • 0818647981
  • 0818687983
• LCCN: 87080439
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington, D.C.,Los Angeles, CA
• ページ数/冊数: xxxi, 1151 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC19 : 621.381/73
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Electronic digital computers -- Circuits -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses