The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985

Author(s)

• International Test Conference
• IEEE Computer Society
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985

sponsored by the IEEE Computer Society, IEEE Philadelphia Section

IEEE Computer Society Press , Order from IEEE Computer Society, 1985

• pbk.
• hard
• microfiche

Note

Includes bibliographies and index

"IEEE catalog no. 85CH2230-1."

"Computer Society order no. 641."

Details

• NCID: BA04429039
• ISBN:
  • 081860641X
  • 0818646411
• LCCN: 85062324
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Washington, D.C.,Los Angeles, CA
• Pages/Volumes: xxx, 988 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC19 : 621.381/73
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Semiconductors -- Testing -- Congresses