Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986

Author(s)

• International Test Conference
• IEEE Computer Society
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986

sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section

IEEE Computer Society Press, c1986

• pbk.
• microfiche
• hard

Note

Includes bibliographies and index

"IEEE catalog no. 86CH2339-0."

• NCID: BA04429152
• ISBN:
  • 0818607262
  • 0818647264
  • 0818687266
• LCCN: 86228406
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Washington, D.C.
• Pages/Volumes: xxx, 1009 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC19 : 621.381/73
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Semiconductors -- Testing -- Congresses