Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963

Author(s)

• Symposium on Advances in electron Metallography
• American Society for Testing and Materials. Committee E-4 on Metallography

Bibliographic Information

Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963

（ASTM special technical publication, no. 372）

ASTM, c1964

Note

"Sponsored by Subcommittee XI on Electron Microstructure of Metals of ASTM Committee E-4 on Metallography."

This is v.5 of "ASTM advances in electron metallography series" (data based on Advances in electron metallography, v.6, 1966)

Details

• NCID: BA04549493
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Philadelphia
• Pages/Volumes: vi, 89 p.
• Size: 23 cm
• Parent Bibliography ID:
  • BA00068096