Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963

著者

• Symposium on Advances in electron Metallography
• American Society for Testing and Materials. Committee E-4 on Metallography

書誌事項

Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963

（ASTM special technical publication, no. 372）

ASTM, c1964

注記

"Sponsored by Subcommittee XI on Electron Microstructure of Metals of ASTM Committee E-4 on Metallography."

This is v.5 of "ASTM advances in electron metallography series" (data based on Advances in electron metallography, v.6, 1966)

詳細情報

• NII書誌ID(NCID): BA04549493
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Philadelphia
• ページ数/冊数: vi, 89 p.
• 大きさ: 23 cm
• 親書誌ID:
  • BA00068096