X-ray microscopy II : proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987

著者

• Sayre, David
• International Symposium on X-ray Microscopy

書誌事項

X-ray microscopy II : proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987

D. Sayre ... [et al.] (eds.)

（Springer series in optical sciences, v. 56）

Springer-Verlag, c1988

注記

Based on papers presented at the International Symposium on X-ray Microscopy held at Brookhaven National Laboratory

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA04554427
• ISBN:
  • 0387193928
  • 3540193928
• LCCN: 88020043
• 出版国コード: gw
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Berlin ; New York
• ページ数/冊数: xiv, 454 p.
• 大きさ: 24 cm
• 分類:
  • LCC : QH212.X2
  • DC19 : 535/.332
• 件名:
  • LCSH : X-ray microscope -- Congresses
• 親書誌ID:
  • BA00063354