Testing and diagnosis of VLSI and ULSI
Author(s)
Bibliographic Information
Testing and diagnosis of VLSI and ULSI
（NATO ASI series, ser. E . Applied sciences ; no. 151）
Kluwer Academic Publishers, 1988
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"Published in cooperation with NATO Scientific Affairs Division."
"Proceedings of the NATO Advanced Study Institute on "Testing and Diagnosis of VLSI and ULSI," Como, Italy, June 22-July 3, 1987."
Includes bibliographical references and index
Description and Table of Contents
Description
This volume contains a collection of papers presented at the NATO Advanced Study Institute on *Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the * three months* turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.
Table of Contents
2. Trends in Design for Testability.- 3. Statistical Testing.- 4. Fault Models.- 5. Fault Detection and Design for Testability of CMOS Logic Circuits.- 6. Parallel Computer Systems Testing and Integration.- 7. Analog Fault Diagnosis.- 8. Spectral Techniques for Digital Testing.- 9. Logic Verification, Testing and their Relationship to Logic Synthesis.- 10. Proving the next Stage from Simulation.- 11. Petri Nets and their Relation to Design Validation and Testing.- 12. Functional Test of ASICS and Boards.- 13. Fault Simulation Techniques - Theory and Practical Examples.- 14. Threshold-value Simulation and Test Generation.- 15. Behavioral Testing of Programmable Systems.- 16. Testing of Processing Arrays.- 17. Old and New Approaches for the Repair of Redundant Memories.- 18. Reconfiguration of Orthogonal Arrays by Front Deletion.- 19. Device Testing and SEM Testing Tools.- 20. Advances in Electron Beam Testing.
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