PIXE : a novel technique for elemental analysis
著者
書誌事項
PIXE : a novel technique for elemental analysis
Wiley, c1988
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注記
Includes bibliographies and index
内容説明・目次
内容説明
A comprehensive overview of Proton Induced X-Ray Emission (PIXE), a new analytical technique which is of growing importance for a number of applications is presented in this book. The text begins with a short introduction to the basic theory of the technique and is then divided into two sections. The first is devoted to an in-depth treatment of the physics, the technology and the technique, much of which is directed towards those who already have a degree of familiarity. The second half reviews applications of PIXE in a variety of areas including the biological, environmental, medical, geological and art fields. The two final chapters, one on PIXE in relation to other analytical techniques and the other on future potential, should be particularly important to anyone considering making use of the technique. A large number of references are cited to assist those who wish to follow up specific aspects in more depth.
目次
- Atomic Inner-Shell X-Ray Spectra and X-Ray Spectrometers
- Characteristic X-Rays and Continuous Photon Background Induced by MeV Protons and Helium Ions
- Beam-Handling and Specimen Chamber Design for PIXE in Vacuum
- Thin Specimens: Preparation, Basic Formalism and Detection Limits
- Analysis of Specimens of Intermediate Thickness
- Analysis of Thick Specimens
- Non-Vacuum PIXE
- Further Aspects of Si(Li) Spectroscopy in the Context of PIXE
- Analytical Fitting of PIXE Spectra
- Further Aspects of Thick Specimen Analysis
- Biological and Medical Applications
- Atmospheric Applications
- Applications in Geoscience
- Applications in Art and Archaeology
- Miscellaneous Applications
- Micro-PIXE
- Comparison with Other Methods
- Future Prospects
- Numerical Data.
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