Progress in materials analysis
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書誌事項
Progress in materials analysis
（Mikrochimica Acta, Supplementum 10,
Springer-Verlag, c1983-
- Vol. 1
- v. 2
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注記
Proceedings of the 11th colloquium on metallurgical analysis, Institute for Analytical Chemistry, Technical Univ. in Vienna, Nov. 3-5, 1982
v. 2: Proceedings of the 12th colloquim on Materials Analysis Institute for Analytical Chemistry, Technicla University in Vienna, May 13-15, 1985
内容説明・目次
- 巻冊次
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Vol. 1 ISBN 9783211817599
内容説明
The 11th Colloquium on Metallurgical Analysis - a joint venture of the Institute of Analytical Chemistry of the Technical University in Vienna, the Austrian Society for Analytical Chemistry and Microchemistry, the German Metals Society (DGM), and the Society of German Iron and Steel Engineers (VDEh) - was attended by 120 scientists from 12 nations. The major topics covered were surface, micro and trace analysis of materials with a heavy emphasis on metals. According to the strategy of the meeting attention was focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and tech nology. Therefore progress reports on analytical techniques (like SIMS, SNMS, Positron Annihilation Spectroscopy, AES, XPS) were given as well as pre sentations on the development of materials (like for the fusion reactor). The majority of the discussion papers centered on the treatment of important technical problems in materials science and technology by a (mostly sophis ticated) combination of physical and chemical analytical techniques. The intensive exchange of ideas and results between the scientists oriented towards basic research and the industrial materials technologists was very fruitful and resulted in the establishment of several scientific cooperations. Major trends in materials analysis were also dealt with in a plenary discussion of which a short summary is contained in this volume. In order to facilitate international communication in the field of materials analysis and in view of the important questions treated in the various contri butions this proceedings volume was edited in English.
目次
Materials for the First Wall of Fusion Reactors and Their Analytical Characterization.- Application of Positron Annihilation to Metallic Alloys.- Applications of SIMS in Interdisciplinary Materials Characterization.- Quantitative Secondary Neutral Mass Spectrometry Analysis of Alloys and Oxide-Metal-Interfaces.- Surface Analysis of Metals with SIMS.- Characterization of Metallic Glasses by Ion and Electron Microprobes.- Quantitative Surface Analysis of CVD-Hard Material Coatings with SIMS.- ISS- and SIMS-Analysis of Thin Organic Layers on Metal Surfaces.- New Developments in Spatially Multidimensional Ion Microprobe Analysis.- Investigation of Grain Boundary Segregation in Iron-Base Alloys by Auger Electron Spectroscopy.- Characterization of Anodic Oxide Layers by Sputter Profiling with AES and XPS.- Investigations of Phosphate Coatings of Galvanized Steel Sheets by a Surface-Analytical Multi-Method Approach.- Surface- and Microanalytical Investigations of the Chemical Constitution of the Grain Boundary Phase in Dense Silicon Nitride.- Analysis of Reactively Ion Plated Titanium-Nitride Films.- Quantitative Surface Analysis Without Reference Samples.- Improved Methods of Quantitative Electron Probe Microanalysis of Carbon-?(?z) Compared to Other Methods.- Quantitative Electron Probe Microanalysis of Sputtered FeC Dry Lubrication Films.- Experimental and ZAF Correction Aspects of Carbon Analysis in Steels: Application to the Carburization of Irradiated Uranium-Plutonium Carbide Fuel Pin Claddings.- Quantitative Electron Probe Microanalysis of Borides in Aluminium.- Microprobe Measurements to Determine Phase Boundaries and Diffusion Paths in Ternary Phase Diagrams Taking a Cu-Ni-Al System as an Example.- Investigation of (Mo, W)C Mixed Carbides by Electron Probe Microanalysis and Kossel Technique.- X-Ray Emission Spectroscopy by Means of Electron-Microprobe for the Determination of the Density of States with Binary Amorphous Alloys.- X-Ray Excited Fluorescence Spectroscopy Within SEM for Trace Analysis.- STEM-EDX Measurements on Grain Boundary Phenomena of Sensitized Chrome-Nickel Steels.- Metallurgical Investigations of Microstructure and Behaviour of High-Alloyed Manganese-Chromium Austenitic Steels for Generator-Rotor Retaining Rings.- Analytical Electron Microscopy for Interface Characterization - Corrosion of Concrete.- Electron Microscope Characterization of Highest-Coercivity Magnetic Materials.- Multi-Element Preconcentration from Technical Alloys.- Application of the Levitation Melting Technique in the Investigations of Iron and Steel Making.
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v. 2 ISBN 9783211819050
内容説明
Vol. 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals ............................................. .
目次
Surface Characterization of Thin Organic Films on Metals.- Analysis of Very Thin Organic Fibres by Means of Small Spots Electron Spectroscopy for Chemical Analysis.- Ion Implantation in the Surface Analysis of Solid Materials.- Comparison of Ion Implantation Profiles Obtained by AES/Sputtering Measurements and Monte Carlo Calculations.- Microfocussed Ion Beams for Surface Analysis and Depth Profiling.- Secondary Neutral Mass Spectrometry Depth Profile Analysis of Silicides.- Analysis of Thin Chromate Layers on Aluminium. I. Opportunities and Limitations of Surface Analytical Methods.- Analysis of Thin Chromate Layers on Aluminium. II. Structure and Composition of No-rinse Conversion Layers.- Surface Analytical Investigation of the Corrosion Behaviour of Ti(Pd) Samples.- Determination of the Lubricant Thickness Distribution on Magnetic Disks by Means of X-Ray Induced Volatilization and Simultaneous Photoelectron Spectroscopy.- Internal Quantification of Glow Discharge Optical Spectroscopy-Depth Profiles of Oxide and Nitride Layers on Metals.- Element Profiling by Secondary Ion Mass Spectrometry of Surface Layers in Glasses.- Neutral Primary Beam Secondary Ion Mass Spectrometry Analysis of Corrosion Phenomena on Glass Surfaces.- Quantitative Distribution Analysis of Phosphorus in Silicon with Secondary Ion Mass Spectrometry.- Positron Studies of Defects in Metals and Semiconductor.- Kossel Technique and Positron Annihilation Used to Clarify Sintering Processes.- Selection and Qualification Tests of High Temperature Materials by Special Microanalytical Methods.- On the Application of Acoustic Emission Analysis to Evaluate the Integrity of Protective Coatings t on High-Temperature Alloys.- Microprobe Measurements to Determine the Melt Equilibria of High-Alloy Nickel Materials.- Experimental Determination of the Depth Distribution of X-Ray Production ?(?z) for X-Ray Energies Below 1 keV.- Electron Probe Microanalysis of Oxygen and Determination of Oxide Film Thickness Using Gaussian ?(?z) Curves.- Procedures to Optimize the Measuring Methods in the Electron Probe Microanalysis of Low Energy X-Rays.- Quantitative Microstructural Analysis of Sintered Silicon Nitride by Using a Thin-Window Energy Dispersive X-Ray Detector System.- Optimizing the Microstructure of Implant Alloy TiA15Fe2.5 by Microprobe Analysis.- Characterization of Technical Surfaces With a Coupled SEM-EDA-Image Analyzer System.- Microanalytical Characterization of a Powder Metallurgical Ledeburitic Tool Steel by Transmission Electron Microscopy.- Determination of the Bonding Behaviour of Carbon and Nitrogen in Micro-Alloyed Structural Steels.- Analytical Electron Microscopy of Rare-Earth Permanent Magnet Materials.
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