Laser techniques for investigation of defects in semiconductors and dielectrics

Author(s)

• Manenkov, A. A.

Bibliographic Information

Laser techniques for investigation of defects in semiconductors and dielectrics

edited by A.A. Manenkov ; translated by Kevin S. Hendzel

（Proceedings of the Institute of General Physics, Academy of the Sciences of the USSR, v. 4）

Nova Science Publishers, c1988

Note

"Translated by Kevin S. Hendzel

The original Russian-language version of this book was published by Nauka Publishing House in 1986

Includes index

Details

• NCID: BA06545981
• ISBN:
  • 0941743152
• LCCN: 88006622
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Original Language Code: rus
• Place of Publication: Commack [N.Y.]
• Pages/Volumes: 204 p.
• Size: 25 cm
• Classification:
  • LCC : QC611.6.D4
  • DC19 : 621.3815/2
• Subject Headings:
  • LCSH : Semiconductors -- Defects
  • LCSH : Dielectrics -- Defects
  • LCSH : Laser beams
• Parent Bibliography ID:
  • BA03913808