Laser techniques for investigation of defects in semiconductors and dielectrics

著者

• Manenkov, A. A.

書誌事項

Laser techniques for investigation of defects in semiconductors and dielectrics

edited by A.A. Manenkov ; translated by Kevin S. Hendzel

（Proceedings of the Institute of General Physics, Academy of the Sciences of the USSR, v. 4）

Nova Science Publishers, c1988

注記

"Translated by Kevin S. Hendzel

The original Russian-language version of this book was published by Nauka Publishing House in 1986

Includes index

• NII書誌ID(NCID): BA06545981
• ISBN:
  • 0941743152
• LCCN: 88006622
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 原本言語コード: rus
• 出版地: Commack [N.Y.]
• ページ数/冊数: 204 p.
• 大きさ: 25 cm
• 分類:
  • LCC : QC611.6.D4
  • DC19 : 621.3815/2
• 件名:
  • LCSH : Semiconductors -- Defects
  • LCSH : Dielectrics -- Defects
  • LCSH : Laser beams
• 親書誌ID:
  • BA03913808