Surface and interface characterization by electron optical methods

著者

• NATO Advanced Study Institute on the Study of Surfaces and Interfaces by Electron Optical Techniques
• Howie, A.
• Valdrè, U. (Ugo)

書誌事項

Surface and interface characterization by electron optical methods

edited by A. Howie and U. Valdrè

（NATO ASI series, ser. B, Physics ; v. 191）

Plenum Press, c1988

注記

"Proceedings of a NATO Advanced Study Institute on the Study of Surfaces and Interfaces by Electron Optical Techniques, held April 4-15, 1987, in Erice, Sicily, Italy"--CIP t.p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA06646162
• ISBN:
  • 030643086X
• LCCN: 88028989
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: viii, 319 p.
• 大きさ: 26 cm
• 分類:
  • LCC : QC173.4.S94
  • DC19 : 530.4/1
• 件名:
  • LCSH : Surfaces (Physics) -- Technique -- Congresses
  • LCSH : Electron microscopy -- Congresses
  • LCSH : Electron microscope, Transmission -- Congresses
• 親書誌ID:
  • BA00020624