Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983

Author(s)

• Benninghoven, A.
• International Conference on Secondary Ion Mass Spectrometry

Bibliographic Information

Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983

editors, A. Benninghoven ... [et al.]

（Springer series in chemical physics, v. 36）

Springer Verlag, 1984

• : U.S.
• : GW

Note

"Fourth International Conference on Secondary Ion Mass Spectrometry]"--Pref

Includes bibliographical references and index

Details

• NCID: BA06696320
• ISBN:
  • 038713316X
  • 354013316X
• LCCN: 84005330
• Country Code: gw
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Berlin ; New York
• Pages/Volumes: xv, 503 p.
• Size: 24 cm
• Classification:
  • LCC : QD96.S43
  • DC19 : 543/.0873
• Subject Headings:
  • LCSH : Secondary ion mass spectrometry -- Congresses
• Parent Bibliography ID:
  • BA00212625