Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983

著者

• Benninghoven, A.
• International Conference on Secondary Ion Mass Spectrometry

書誌事項

Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983

editors, A. Benninghoven ... [et al.]

（Springer series in chemical physics, v. 36）

Springer Verlag, 1984

• : U.S.
• : GW

注記

"Fourth International Conference on Secondary Ion Mass Spectrometry]"--Pref

Includes bibliographical references and index

• NII書誌ID(NCID): BA06696320
• ISBN:
  • 038713316X
  • 354013316X
• LCCN: 84005330
• 出版国コード: gw
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Berlin ; New York
• ページ数/冊数: xv, 503 p.
• 大きさ: 24 cm
• 分類:
  • LCC : QD96.S43
  • DC19 : 543/.0873
• 件名:
  • LCSH : Secondary ion mass spectrometry -- Congresses
• 親書誌ID:
  • BA00212625