{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA06758290.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA06758290#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA06758290.json"},"dc:title":[{"@value":"Basic engineering circuit analysis"}],"dc:creator":"J. David Irwin","dc:publisher":[{"@value":"Macmillan Pub. Co."},{"@value":"Collier Macmillan Publishers"}],"dcterms:extent":"xvi, 828 p.","cinii:size":"25 cm","dc:language":"und","dc:date":"1987","cinii:ncid":"BA06758290","prism:edition":"2nd ed","cinii:ownerCount":"7","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA03144051#entity","@type":"foaf:Person","foaf:name":[{"@value":"Irwin, J. David"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA02289X","@type":"foaf:Organization","foaf:name":"九州大学 理系図書館","rdfs:seeAlso":{"@id":"https://catalog.lib.kyushu-u.ac.jp/opac_openurl/?ncid=BA06758290"}},{"@id":"https://ci.nii.ac.jp/library/FA012331","@type":"foaf:Organization","foaf:name":"帝京大学 宇都宮キャンパス 図書館","rdfs:seeAlso":{"@id":"https://opac.teikyo-u.ac.jp/iwjs0016opc/ufirdi.do?ufi_target=ctlsrh&ncid=BA06758290"}},{"@id":"https://ci.nii.ac.jp/library/FA007852","@type":"foaf:Organization","foaf:name":"大阪産業大学 綜合図書館","rdfs:seeAlso":{"@id":"https://library.cnt.osaka-sandai.ac.jp/gate?module=search&path=search&method=search&searchForm.library=true&searchForm.orderNumber=BA06758290"}},{"@id":"https://ci.nii.ac.jp/library/FA008607","@type":"foaf:Organization","foaf:name":"広島工業大学 附属図書館","rdfs:seeAlso":{"@id":"https://libwww.cc.it-hiroshima.ac.jp/intrasite/CARINOPACLINK.htm?ONI=BA06758290"}},{"@id":"https://ci.nii.ac.jp/library/FA012670","@type":"foaf:Organization","foaf:name":"石巻専修大学 図書館","rdfs:seeAlso":{"@id":"https://opac.lib.senshu-u.ac.jp/iwjs0008isu/ctlsrh.do?ncid=BA06758290"}},{"@id":"https://ci.nii.ac.jp/library/FA013866","@type":"foaf:Organization","foaf:name":"鈴鹿医療科学大学 附属図書館"},{"@id":"https://ci.nii.ac.jp/library/FA024476","@type":"foaf:Organization","foaf:name":"帝京科学大学 附属図書館 千住図書館","rdfs:seeAlso":{"@id":"https://www.lib.ntu.ac.jp/opac/opac_openurl?ncid=BA06758290"}}],"bibo:lccn":["86009747"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/86009747"}],"prism:publicationDate":[null,"c1987"],"cinii:note":["Bibliography: p. 798-799","Includes index"],"dc:subject":["LCC:TK454","DC19:621.319/2"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Electric+circuit+analysis","dc:title":"Electric circuit analysis"}],"dcterms:hasPart":[{"@id":"urn:isbn:0023598603"}]}]}