{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA06955043.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA06955043#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA06955043.json"},"dc:title":[{"@value":"Handbook of microwave testing"}],"dc:creator":"Thomas S. Laverghetta","dc:publisher":[{"@value":"Artech"}],"dcterms:extent":"518 p.","cinii:size":"24 cm","dc:language":"eng","dc:date":"1981","cinii:ncid":"BA06955043","cinii:ownerCount":"10","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA0154570X#entity","@type":"foaf:Person","foaf:name":[{"@value":"Laverghetta, Thomas S."}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA001109","@type":"foaf:Organization","foaf:name":"北海道大学 大学院工学研究科・工学部図書室","rdfs:seeAlso":{"@id":"https://opac.lib.hokudai.ac.jp/opac/opac_openurl/?ncid=BA06955043"}},{"@id":"https://ci.nii.ac.jp/library/FA004082","@type":"foaf:Organization","foaf:name":"兵庫県立大学 姫路工学学術情報館","rdfs:seeAlso":{"@id":"https://lib.laic.u-hyogo.ac.jp/opac/search?target=local&searchmode=complex&autoDetail=true&s_ncid=BA06955043"}},{"@id":"https://ci.nii.ac.jp/library/FA006204","@type":"foaf:Organization","foaf:name":"東洋大学 附属図書館 川越図書館","rdfs:seeAlso":{"@id":"https://triton.lib.toyo.ac.jp/gate?module=search&path=search.do&method=search&searchForm.library=true&searchForm.orderNumber=BA06955043"}},{"@id":"https://ci.nii.ac.jp/library/FA006339","@type":"foaf:Organization","foaf:name":"日本大学 工学部図書館","rdfs:seeAlso":{"@id":"https://celib.nihon-u.ac.jp/opac/opac_openurl/?ncid=BA06955043"}},{"@id":"https://ci.nii.ac.jp/library/FA006893","@type":"foaf:Organization","foaf:name":"湘南工科大学 附属図書館","rdfs:seeAlso":{"@id":"https://lib.shonan-it.ac.jp/CARIN/CARINOPACLINK.HTM?OAL=BA06955043"}},{"@id":"https://ci.nii.ac.jp/library/FA007965","@type":"foaf:Organization","foaf:name":"関西大学 図書館","rdfs:seeAlso":{"@id":"https://www.lib.kansai-u.ac.jp/webopac/ufirdi.do?ufi_target=ctlsrh&ncid=BA06955043"}},{"@id":"https://ci.nii.ac.jp/library/FA008913","@type":"foaf:Organization","foaf:name":"福岡大学 図書館","rdfs:seeAlso":{"@id":"https://fuopac.lib.fukuoka-u.ac.jp/opac/opac_openurl/?ncid=BA06955043"}},{"@id":"https://ci.nii.ac.jp/library/FA008935","@type":"foaf:Organization","foaf:name":"福岡工業大学 附属図書館","rdfs:seeAlso":{"@id":"https://opsv-fit.lib.fit.ac.jp/opc/recordID/catalog.bib/BA06955043"}},{"@id":"https://ci.nii.ac.jp/library/FA009177","@type":"foaf:Organization","foaf:name":"大学共同利用機関法人 高エネルギー加速器研究機構","rdfs:seeAlso":{"@id":"https://lib-extopc.kek.jp/opac/opac_openurl/?ncid=BA06955043"}},{"@id":"https://ci.nii.ac.jp/library/FA009199","@type":"foaf:Organization","foaf:name":"情報・システム研究機構 国立極地研究所 情報図書室","rdfs:seeAlso":{"@id":"https://libsv.nipr.ac.jp/opac/search?target=local&searchmode=complex&autoDetail=true&s_ncid=BA06955043"}}],"bibo:lccn":["81067941"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/81067941"}],"prism:publicationDate":["c1981"],"cinii:note":["Includes bibliographical references and index"],"dc:subject":["LCC:TK7876","DC19:621.381/37"],"cinii:relation":[{"@id":"https://ci.nii.ac.jp/ncid/BA63722295#entity","dc:title":"Handbook of microwave testing","cinii:ncid":"BA63722295"}],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Microwave+measurements","dc:title":"Microwave measurements"}],"dcterms:hasPart":[{"@id":"urn:isbn:0890060703"}]}]}