New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC

著者

• International Test Conference
• IEEE Computer Society. Test Technology Technical Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC

sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section

Computer Society Press of the IEEE, c1988

• paper
• microfiche
• case

タイトル別名

88CH26104

注記

"Computer Society order number 870."

"IEEE catalog number 88CH2610-4."

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA06995955
• ISBN:
  • 0818608706
  • 0818648708
  • 081868870X
• LCCN: 88070912
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington, D.C.
• ページ数/冊数: xxx, 1005 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC19 : 621.395
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Electronic digital computers -- Circuits -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses