Advanced techniques for microstructural characterization : proceedings of Indo-US Workshop sponsored by the Department of Science & Technology, Govt. of India and Office of Naval Research, Washington, D.C., U.S.A., held at Bombay during January 11-13, 1988

著者

• Indo-US Workshop on Advanced Techniques for Microstructural Characterization
• Krishnan, R.

書誌事項

Advanced techniques for microstructural characterization : proceedings of Indo-US Workshop sponsored by the Department of Science & Technology, Govt. of India and Office of Naval Research, Washington, D.C., U.S.A., held at Bombay during January 11-13, 1988

editors, R. Krishnan... [et al.]

Trans Tech Pub., c1988

注記

Includes bibliographical references and index

Crystal properties & preparation. Vol. 16(1988)

内容説明・目次

内容説明

Coverage includes: metallic glasses; X-ray topography; auger spectroscopy; positron annihilation; and field ion microscopy.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA07029547
• ISBN:
  • 0878495630
• 出版国コード: sz
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Aedermannsdorf, Switzerland
• ページ数/冊数: 275 p.
• 大きさ: 25 cm