Advanced techniques for microstructural characterization : proceedings of Indo-US Workshop sponsored by the Department of Science & Technology, Govt. of India and Office of Naval Research, Washington, D.C., U.S.A., held at Bombay during January 11-13, 1988
著者
書誌事項
Advanced techniques for microstructural characterization : proceedings of Indo-US Workshop sponsored by the Department of Science & Technology, Govt. of India and Office of Naval Research, Washington, D.C., U.S.A., held at Bombay during January 11-13, 1988
Trans Tech Pub., c1988
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注記
Includes bibliographical references and index
Crystal properties & preparation. Vol. 16(1988)
内容説明・目次
内容説明
Coverage includes: metallic glasses; X-ray topography; auger spectroscopy; positron annihilation; and field ion microscopy.
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