General aspect

Author(s)

• Sandell, E. B. (Ernest Birger)
• 大西, 寛 オオニシ, ヒロシ

Bibliographic Information

General aspect

E. B. Sandell and Hiroshi Onishi

（Chemical analysis, v. 3 . Photometric determination of traces of metals ; pt. 1., 2）

Wiley, 1978

4th ed

Note

"A Wiley-Interscience publication."

Includes bibliographical references and indexes

Details

• NCID: BA07242114
• ISBN:
  • 0471030945
• LCCN: 77018937
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: 2v.
• Size: 24 cm
• Classification:
  • LCC : QD139.T7
  • DC : 546/.3
• Subject Headings:
  • LCSH : Trace elements -- Analysis
  • LCSH : Metals -- Analysis
  • LCSH : Colorimetric analysis
• Parent Bibliography ID:
  • BA00071272