Unified methods for VLSI simulation and test generation

Author(s)

• Cheng, Kwang-Ting
• Agrawal, Vishwani D.

Bibliographic Information

Unified methods for VLSI simulation and test generation

by Kwang-Ting Cheng and Vishwani D. Agrawal

（The Kluwer international series in engineering and computer science, SECS 73 . VLSI, computer architecture and digital signal processing）

Kluwer Academic Publishers, c1989

Note

At head of title: AT & T

Bibliography: p. [113]-143

Includes index

Details

• NCID: BA07295788
• ISBN:
  • 0792390253
• LCCN: 89034073
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Boston
• Pages/Volumes: xii, 148 p.
• Size: 25 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.39/5
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Design and construction -- Data processing
  • LCSH : Computer-aided design
  • LCSH : Integrated circuits -- Very large scale integration -- Testing
  • LCSH : Integrated circuits -- Very large scale integration -- Computer simulation
• Parent Bibliography ID:
  • BA0004729X